Surface Diffraction Beamline at the SSRF

BL02U2 of the Shanghai Synchrotron Radiation Facility (SSRF) is a surface diffraction beamline with a photon flux of 5.5 × 1012 photons/s at 10 keV and a beam size of 160×80 µm2 at the sample site. It is dedicated to studying surfaces (solid–vacuum, solid–gas) and interfaces (solid–solid, solid–liquid, and liquid–liquid) in nanoscience, condensed matter, and soft matter systems using various surface scattering techniques over an energy range of 4.8–28 keV with transmission and reflection modes. Moreover, BL02U2 has a high energy resolution, high angular resolution, and low beam divergence, which can provide excellent properties for X-ray diffraction experiments, such as grazing incident X-ray diffraction, X-ray reflectivity, crystal truncation rods, and liquid X-ray scattering. Diversity of in-situ environments can also be provided for the samples studied. This paper describes the setup of the new beamline and its applications in various fields.