参考拓扑驱动的宽场显微成像非参数化畸变校正OA
Reference topology driven non-parametric distortion correction for wide-field microscopy
提出一种参考拓扑驱动的非参数化畸变校正方法.首先,设计了多链邻域追踪算法,利用特征点阵列的局部连通性先验取代全局坐标约束,在无位姿信息条件下稳健构建了畸变点阵的参考拓扑;进而根据参考拓扑结构,以中心锚定策略分级建立校正基准,引入径向基函数插值模型对畸变分量重建叠加,精确重建复合畸变场.仿真结果表明:本文方法对大角度旋转、复合畸变、特征点缺失等挑战性工况实现了鲁棒的畸变校正;显示面板大视场拼接的畸变校正实验结果表明,本文方法显著提升了拼接区域元件电路的几何一致性.
A reference topology driven non-parametric distortion correction method was proposed.Firstly,a multi-chain neighborhood tracing algorithm was designed,in which the local connectivity prior of feature point arrays was utilized to replace global coordinate constraints,and the reference topology of distorted lattices was robustly constructed without pose information.Subsequently,based on the reference topology,correction benchmarks were hierarchically established via a center-anchored strategy,and a radial basis function(RBF)interpolation model was introduced to reconstruct and superimpose distortion components,whereby the composite distortion field was accurately reconstructed.Simulation results show that robust distortion correction is achieved by the proposed method under challenging conditions such as large-angle rotation,composite distortion,and missing feature points.Experimental results of distortion correction for large-field-of-view stitching of display panels demonstrate that the geometric consistency of component circuits in the stitching area is significantly improved by the proposed method.
杨敬钰;胡昆澍;陈思远;岳焕景
天津大学电气自动化与信息工程学院,天津 300072天津大学电气自动化与信息工程学院,天津 300072天津大学电气自动化与信息工程学院,天津 300072天津大学电气自动化与信息工程学院,天津 300072
信息技术与安全科学
宽场显微成像节点像差理论参考拓扑中心锚定非参数化场重建自动光学检测
wide-field microscopynodal aberration theoryreference topologycenter anchoringnon-parametric field reconstructionautomated optical inspection
《华中科技大学学报(自然科学版)》 2026 (9)
1-7,7
国家自然科学基金资助项目(62231018).
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