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基于CNN-Transformer双流融合模型的集成电路故障诊断方法研究OA

中文摘要英文摘要

集成电路高集成、高密度化发展趋势下,其内部结构越发复杂.传统故障诊断模型已经难以满足高效、精准故障诊断的需求.为此,研究提出利用卷积神经网络(CNN)和 Transformer 实现的集成电路故障诊断双流融合方法.该方法利用 CNN 模型局部特征提取能力的优势,精确抽取集成电路故障数据中的空间局部特征;同时借助 Transformer 模型的自注意力机制提取数据中所隐含的长距离依赖关系,深度挖掘集成电路故障数据中的全局特征.通过设计合理的特征融合模块,将 2 路模型提取的特征进行有效的融合,充分利用 2 种模型的互补性.为检验所提方法的有效性,以 LM324 运算放大器为测试芯片,基于自建的 IC-Fault-2023 数据集构建实验数据,建立专用测试平台开展试验,并将所提方法与 CNN 模型、Transformer 模型、传统机器学习算法进行对比.实验结果表明,该种融合模型的故障诊断准确率达 96.87%,相较于单一 CNN 模型提升 4.72%,且单次推理耗时仅为 8.3 ms,满足实时性要求;其召回率和 F1 值均优于对比模型,有效提高集成电路故障诊断效果,为复杂集成电路的故障诊断提供参考.

With the development trend of high integration and high density of integrated circuits,their internal structures have become increasingly complex.Traditional fault diagnosis models have been unable to meet the needs of efficient and accurate fault diagnosis.To this end,a dual-flow fusion method for integrated circuit fault diagnosis using convolutional neural networks(CNN)and transformers is proposed.This method takes advantage of the local feature extraction ability of the CNN model to accurately extract spatial local features from integrated circuit fault data;at the same time,the self-attention mechanism of the Transformer model extracts long-distance dependencies hidden in the data to deeply mine global features in integrated circuit fault data.By designing a reasonably designed feature fusion module,the features extracted from the two models are effectively fused,making full use of the complementarity of the two models.In order to test the effectiveness of the proposed method,an LM324 operational amplifier was used as a test chip,experimental data was built based on the self-built IC-Fault-2023 dataset,a dedicated test platform was established to carry out experiments,and the proposed method was compared with CNN models,Transformer models,traditional machine learning algorithms.Experimental results show that the fault diagnosis accuracy rate of this fusion model reaches 96.87%,which is 4.72%higher than that of a single CNN model,and the single inference time is only 8.3 ms,meeting the real-time requirements;its recall rate and F1 value are both better than the comparative model,effectively improving the integrated circuit fault diagnosis effect and providing reference for the fault diagnosis of complex integrated circuits.

李莹

天津现代职业技术学院,天津 300350

信息技术与安全科学

CNN-Transformer双流融合模型集成电路故障诊断算法模型

CNN-Transformerdual-flow fusion modelintegrated circuitfault diagnosisalgorithm model

《科技创新与应用》 2026 (28)

60-64,5

10.19981/j.CN23-1581/G3.2026.28.013

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