石英晶格杂质及微区原位分析技术研究进展OA

[Objective]High purity quartz serves as a strategically critical mineral resource for China's emerging industries,with its processed products extensively utilized in photovoltaic,electronic information,semiconductor and related high-tech sectors.Currently,China predominantly relies on imported supplies for 4N8-grade and above high purity quartz sand(SiO2 purity≥99.998%),creating an urgent need to enhance domestic prospecting evaluation and resource development of high-grade deposits.Micro-scale in situ analysis techniques enable rapid screening of potential high-purity quartz resources,thereby significantly improving the efficiency of resource assessment.[Methods]Through systematic compilation of published literature and integration of previous research findings,this study summarizes current micro-scale in situ analytical techniques,while comprehensively evaluating their technological progress,methodological limitations and future development trends.[Results]Three principal techniques demonstrate distinct characteristics:LA-ICP-MS provides low detection limits and multi-element capability but suffers from limited spatial resolution;EPMA offers high spatial resolution and non-destructive analysis yet has higher detection limits and is susceptible to various error factors;SIMS delivers exceptional sensitivity but is constrained by strong matrix effects and lacks standardized reference materials.[Conclusions]While each technique exhibits unique advantages,integrated analytical approaches can significantly enhance impurity characterization accuracy.Future development should prioritize reference material development,detection limit optimization and analytical precision improvement to establish a comprehensive evaluation framework based on lattice impurity signatures.