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基于MEMS工艺的C波段硅基微带滤波器设计与制备OA

Design and fabrication of a C-band silicon-based microstrip filter using MEMS technology

中文摘要英文摘要

针对射频集成系统对小型化、高性能及可高密度集成的需求,基于硅基微电子机械系统(MEMS)加工工艺,设计并制备了一款尺寸为 7.1mm×5.6mm×0.8mm的C波段微带带通滤波器.该滤波器采用短路 1/4 波长微带线为基本谐振结构,利用耦合系数和外部品质因数法,借助三维电磁仿真软件实现滤波器性能设计.滤波器设计指标:中心频率 6.1 GHz,相对带宽 19.67%,通带范围内插入损耗小于 2.5 dB,带内回波损耗大于 15 dB,带外抑制在 4.3 GHz和 7.9 GHz处大于 35 dB.器件采用硅基MEMS工艺加工,通过优化磁控溅射工艺降低金膜层表面粗糙度,并通过改进深反应离子刻蚀工艺提高硅通孔垂直度.测试结果显示滤波器中心频率为 6.12 GHz,插入损耗小于 2.5 dB,带外抑制在 4.3 GHz和 7.9 GHz处大于 38 dB,测试结果与仿真结果基本吻合.

To address the demand of radio frequency integrated systems for miniaturized,high-performance,and densely integrated filters,a C-band microstrip band-pass filter with dimensions of 7.1 mm×5.6 mm×0.8 mm was designed and fabricated using a silicon-based microelectromechanical systems(MEMS)process.The filter employed short-circuited quarter-wavelength microstrip lines as the fundamental resonant structure.And its synthesis integrates coupling coefficients and external-quality-factor method was adopted,and three-dimensional electromagnetic simulation was utilized to optimize fitter performance.Target specifications include a center frequency of 6.1 GHz,a relative bandwidth of 19.67%,insertion loss below 2.5 dB within the passband,a return loss greater than 15 dB,and out-of-band suppression above 35 dB at 4.3 GHz and 7.9 GHz.The device was fabricated using silicon-based MEMS processes:magnetron sputtering parameters were optimized to reduce the surface roughness of gold film,and the deep reactive-ion-etching process was improved to enhance the verticality of through-silicon vias.The measured results show a center frequency of 6.12 GHz,an insertion loss lower than 2.5 dB,and out-of-band suppression above 38 dB at 4.3 GHz and 7.9 GHz,showing good agreement with the simulation results.

胡晓春;袁海;王玲;吴思诚;刘明辉

西安微电子技术研究所,陕西 西安 710054西安微电子技术研究所,陕西 西安 710054西安微电子技术研究所,陕西 西安 710054西安微电子技术研究所,陕西 西安 710054西安微电子技术研究所,陕西 西安 710054

信息技术与安全科学

MEMS工艺硅基滤波器微带线小型化

MEMS processsilicon-based filtermicrostrip lineminiaturization

《电子元件与材料》 2026 (8)

924-929,6

国家自然科学基金(U2541273)

10.14106/j.cnki.1001-2028.2026.0042

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