参考模板引导的PCB缺陷选择性局部复检方法OA

To address the issues that small-scale defects on printed circuit boards(PCBs)exhibit weak responses in whole-image inference and are easily filtered out by fixed working thresholds,as well as the problem that direct fusion of local re-inspection results tends to introduce false alarms,this paper proposes a reference template-guided selective local re-inspection method for PCB defects.The method performs whole-image detection on both the test PCB image and the template-difference enhanced image,then fuses the two whole-image detection outputs in a class-wise manner and filters them with a working threshold to obtain a base whole-image fusion result.Meanwhile,a candidate threshold is used to filter and fuse the two whole-image detection outputs to retain weak-response candidate regions.For each image,at most two candidate regions are selected for local re-inspection.Finally,the expert outputs are screened and fused based on the base whole-image fusion result,the triggered category,spatial overlap relationships,and the confidence of the expert outputs.Experimental results on the DeepPCB test set show that the proposed method achieves a recall of 98.21％and an Fl-score of 97.27％,which are 4.65 and 2.42 percentage points higher than those of the baseline detector,respectively,and reduces the number of missed detections by 70,indicating that the method can effectively supplement weak-response missed detections and suppress newly introduced false alarms at low additional inference cost.