Scalable TCNQ-Doped Graphene Oxide Sensor for Neuromorphic Machine VisionOA
Scalable TCNQ-Doped Graphene Oxide Sensor for Neuromorphic Machine Vision
Xinyu HUANG;Junchao REN;Kun YIN;Hui YU;Yong WANG;Jihong WANG;Lin WANG;Hao SHI;Wenting JIAO;Tangjie MU;Yang GAO;Menglai ZHANG;Lei ZHANG
Zhejiang Lab,Hangzhou 311100,ChinaShanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201210,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,ChinaShanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201210,ChinaKey Laboratory of Smart Manufacturing in Energy Chemical Process,Ministry of Education of the People's Republic of China,East China University of Science and Technology,Shanghai 200237,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,China||Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201210,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,ChinaZhejiang Lab,Hangzhou 311100,China
Neuromorphic machine visiongraphene oxideprogrammable sensor arraysconvolutional neural networks
Neuromorphic machine visiongraphene oxideprogrammable sensor arraysconvolutional neural networks
《光子传感器（英文版）》 2026 (2)
23-39,17
This work was supported by the National Key Research and Development Program of China(Grant No.2022YFB2901000),the Science and Technology Program of Zhejiang,China(Grant No.2025C01043),the National Natural Science Foundation of China(Grant No.12204436),the Zhejiang Provincial Natural Science Foundation of China(Grant No.LQ24A040011),the Postdoctoral Fellowship Program of China Postdoctoral Science Foundation(Grant No.GZC20252242),the National Natural Science Foundation of China(Grant No.12305362),and the National Key Research & Development Program of China(Grant No.2021YFA1601003).The authors thank the Nano Fabrication Center of Zhejiang Laboratory for device fabrication and characterization and the Shiyanjia Laboratory(www.shiyanjia.com)for the XPS test.
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