计及智能软开关运行寿命损耗的光伏高渗透配电网有功-无功协同优化策略OA

With the implementation of the"dual carbon"goals and the development of new power systems,the installed capacity of renewable energy sources such as photovoltaics and wind power in China has reached new highs,contributing to the construction of a low-carbon,efficient,and sustainable power system.As a high proportion of distributed energy sources are integrated into the distribution network through power electronic devices,the distribution network is gradually exhibiting significant characteristics of power electronics.In a power electronicized distribution network,large numbers of inverters,rectifiers,and other devices can precisely control and regulate the grid,effectively addressing issues such as reverse power flow,increased network losses,line overloads,and voltage violations. Firstly,analyze the impact of key power electronic devices(IGBTs,capacitors)on the lifetime of soft open point(SOP)and propose a method for quantifying SOP fatigue damage evaluation based on the distribution network mission profile.Secondly,considering the impact of mission profile uncertainty on the accuracy of SOP lifetime evaluation,use the conditional Wasserstein generative adversarial network with gradient penalty(CWGAN-GP)model to characterize the uncertainty in SOP fatigue damage scenarios and propose a distribution network SOP lifetime quantification evaluation method based on the CWGAN-GP model.This provides a theoretical basis for considering SOP lifetime in the optimization of distribution network operations.Finally,introduce an SOP lifetime damage influence factor and establish an active-reactive power coordination optimization model for photovoltaic high-penetration distribution networks that accounts for SOP lifetime loss,enabling SOPs to participate in the optimization of distribution network operations with high reliability. Simulation results on the IEEE 33-bus test system show that,the fatigue damage scenarios of IGBT devices generated by the CWGAN-GP are almost identical to the cumulative distribution function(CDF)of the real historical device lifetime damage scenarios,indicating that the generated device lifetime damage scenarios not only effectively capture the output characteristics of historical device lifetime damage data but also follow the correct statistical distribution pattern.The SOP lifetime damage influence factors were set to 0.6,0.7,0.8,and 0.9,respectively.As the lifetime damage influence factor decreases,the stability of the IGBT and capacitors significantly deteriorates.However,while extending the SOP lifetime,the operational losses in the distribution network also increase.Therefore,it is evident that a balance must be struck between extending the SOP lifetime and reducing distribution network losses,ultimately determining an optimal SOP lifetime damage influence factor that ensures the long-term stable operation of the SOP while optimizing the operational efficiency of the distribution network. The following conclusions can be drawn from the simulation analysis:(1)A method for quantifying SOP fatigue damage based on the distribution network mission profile is proposed,calculating device fatigue using thermal load and lifetime models.(2)A photovoltaic high-penetration distribution network SOP lifetime evaluation method considering mission profile uncertainty is proposed.The CWGAN-GP model is used to characterize mission profile uncertainty,achieving precise reliability assessment of the SOP.(3)An active-reactive power coordination optimization strategy for photovoltaic high-penetration distribution networks considering SOP lifetime loss is proposed.The lifetime of key devices in SOP is significantly improved,enabling highly reliable SOP participation in distribution network operation.