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利用深度强化学习的SAR ADC量化误差优化方法OA

Method of SAR ADC quantization error optimization based on deep reinforcement learning

中文摘要英文摘要

逐次逼近寄存器型模数转换器(SAR ADC)设计中,由于存在电容失配、比较器失调及噪声扰动等非理想因素,导致其行为级仿真中量化误差较大,有效位数减小,严重影响ADC设计参数的设置.针对这些问题,提出一种基于强化学习的动态策略优化方法.构建ADC性能的非理想因素完整误差模型,并利用深度强化学习(Deep Q-Network)算法对设计参数进行动态调整和优化.以典型的18位两段式SAR ADC为研究对象,通过实验深度挖掘ADC输入电压为0.000 004~0.999 996 V全动态范围(覆盖24 999个等间距电压测试点)对应的量化误差动态映射规律,为SAR ADC的硬件实现提供标准化、可直接调用的参数配置范式,为高精度模数转换系统的工程实现提供具备实用价值的理论参照与数据支撑.

In the design of successive approximation register type analog-to-digital converters(SAR ADCs),non-ideal factors such as capacitor mismatch,comparator misalignment,and noise disturbances lead to increased quantization errors and reduce effective bits in behavioral level simulations,which seriously affect the setting of ADC design parameters.To address these issues,a method of dynamic strategy optimization based on reinforcement learning is proposed.The complete error model of non-ideal factors for ADC performance is constructed,and the deep reinforcement learning algorithm(Deep Q-Network)is used to dynamically adjust and optimize design parameters.By taking a typical 18 bit two-stage SAR ADC as the research object,the dynamic mapping law of quantization error corresponding to the full dynamic range of ADC input voltage from 0.000 004 V to 0.999 996 V(covering 24 999 equidistant voltage testing points)is deeply explored,providing a standardized and directly callable parameter configuration paradigm for the hardware implementation of SAR ADC,and providing practical theoretical reference and data support for the engineering implementation of high-precision analog-to-digital conversion systems.

饶振宇;仝明磊;赵万里;张浚鹏;杨晨

上海电力大学,上海 201306上海电力大学,上海 201306上海电力大学,上海 201306上海电力大学,上海 201306上海电力大学,上海 201306

信息技术与安全科学

逐次逼近寄存器型模数转换器量化误差非理想因素深度强化学习算法动态策略优化参数调整

successive approximation register type analog-to-digital converterquantization errornon-ideal factordeep reinforcement learning algorithmdynamic strategy optimizationparameter adjustment

《现代电子技术》 2026 (16)

13-17,5

10.16652/j.issn.1004-373X.2026.16.003

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