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SMIC 180 nm宽温区电荷灵敏前置放大器芯片研究OA

Study on Wide Temperature Range Charge-Sensitive Preamplifier Based on SMIC 180 nm Process

中文摘要英文摘要

基于宽禁带探测器高能量分辨率、宽工作温度范围及强抗辐射特性的优势,设计了一种宽温区范围低噪声电荷灵敏前置放大器(charge-sensitive preamplifier,CSA).该前置放大器基于SMIC 180 nm工艺进行设计,主要由核心差分运放、带隙基准及输出缓冲器组成,通过优化运算放大器电路结构以及采用全对称运放版图结构获得宽温区、低失调及低噪声的特点.仿真结果表明:该前置放大器可在32 ns的上升时间内完成对亚pC输入电荷信号的有效探测,放大相对偏差小于1%;该电路等效输出阻抗为50 Ω,可在-55~125 ℃内正常工作,灵敏度为1.4 V·pC-1,单粒子最大电荷检测量为0.4 pC,等效噪声电荷(equivalent noise charge,ENC)约为0.09 fC(约 600 个 e-).

Wide-bandgap detectors are characterized by high energy resolution,a wide operating temperature range,and strong radiation resistance.To leverage the advantages of wide-bandgap semiconductor detectors,a low-noise charge-sensitive preamplifier(CSA)suitable for a wide temperature range was designed.The design is based on the SMIC 180 nm process and consists of a core differential operational amplifier,a bandgap reference,and an output buffer.By optimizing the circuit structure of the operational amplifier and employing a fully symmetrical layout,a preamplifier with wide temperature range operation,low offset,and low noise is achieved.Post-simulation results indicate that the preamplifier can effectively detect sub-pC input charge signals within a rise time of 32 ns,with relative deviation of the amplification shall not exceed 1%.The circuit has an equivalent output impedance of 50 Ω,operates normally within the temperature range of-55 ℃ to 125 ℃,exhibits a sensitivity of 1.4 V·pC-1,and has a maximum single-particle charge detection capability of 0.4 pC and an equivalent noise charge of approximately 0.09 fC(600 e-).

乔洋;赵小龙;贺永宁;黄志永;齐文

西安交通大学电子与信息学部微电子学院,西安市微纳电子与系统集成重点实验室,西安 710049西安交通大学电子与信息学部微电子学院,西安市微纳电子与系统集成重点实验室,西安 710049西安交通大学电子与信息学部微电子学院,西安市微纳电子与系统集成重点实验室,西安 710049陕西长岭迈腾电子股份有限公司,宝鸡 721000陕西长岭迈腾电子股份有限公司,宝鸡 721000

能源科技

电荷灵敏前置放大器低噪声宽温区范围核辐射探测集成电路设计

charge-sensitive preamplifierlow noisewide operating temperature rangenuclear radiation detectionintegrated circuit design

《现代应用物理》 2026 (3)

137-143,7

国家自然科学基金资助项目(62271382)

10.12061/j.issn.2095-6223.202512004

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