包含积累层沟道和4H-SiC/Si异质结集电区的SiC基RC-IGBTOA
SiC-Based RC-IGBT with Accumulation Layer Channel and 4H-SiC/Si Heterojunction Collector
构建了一种集成异质结集电区(HJC)和积累层沟道的碳化硅增强型逆导绝缘栅晶体管(HJC-RC-ACCUIGBT),使用积累层沟道而非反型层沟道提高沟道的迁移率,降低器件的阈值电压、比导通电阻,减少栅极氧化物/沟道界面态的不利影响.采用4H-SiC/Si/4H-SiC HJC代替n+型同质集电区来阻碍电子流通,增强电导调制,降低正向导通压降,消除电压折回现象且未弱化其他电学特性.利用TCAD软件仿真和优化了该器件的结构、静态和动态电学特性.结果表明,相对于采用反型层沟道的参照器件,此IGBT的阈值电压降低了 15%,集电区饱和电流密度提高了 32%,栅氧化物/沟道界面态的影响减弱.对比没有HJC的参照器件,此IGBT完全消除了电压折回现象,正向导通压降和反向导通压降分别降低了 72%和12%,此HJC的界面态没有明显影响器件的电学特性.
A silicon carbide enhancement-mode reverse-conducting insulated gate bipolar transistor integrating a heterojunction collector(HJC)and an accumulation layer channel(HJC-RC-ACCUIGBT)is devised.Instead of an inversion layer channel,an accumulation layer channel is adopted to enhance the channel mobility,thereby reducing the threshold voltage,specific on-resistance,and the adverse effects of gate oxide/channel interface states.A 4H-SiC/Si/4H-SiC HJC is employed in place of an n+4H-SiC homogeneous collector to block electron outflow,enhance conductance modulation,reduce the forward voltage drop,and eliminate the snapback phenomenon without compromising other electrical characteristics.The device's structure,as well as its static and dynamic electrical characteristics are simulated and optimized using TCAD software.The results show that,compared to a reference device with an inversion layer channel,this IGBT exhibits a 15%reduction in threshold voltage,a 32%increase in collector saturation current density,and a mitigated influence from gate oxide/channel interface states.Compared to a reference device without an HJC,this IGBT completely eliminates the snapback phenomenon,with the forward and reverse voltage drops reduced by 72%and 12%,respectively.The interface states of the HJC have no significant effect on the device's electrical characteristics.
叶枝展;韦文生
温州大学电气与电子工程学院,浙江温州 325035||温州大学浙江省智能低压电器和新能源应用重点实验室,浙江温州 325035温州大学电气与电子工程学院,浙江温州 325035||温州大学浙江省智能低压电器和新能源应用重点实验室,浙江温州 325035
信息技术与安全科学
RC-IGBT积累层沟道4H-SiC/Si/4H-SiC异质结集电区电压折回现象
RC-IGBTaccumulation layer channel4H-SiC/Si/4H-SiC heterojunction collectorsnapback phenomenon
《电子与封装》 2026 (6)
67-78,12
国家自然科学基金(62374116)
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