一种基于Cortex-M内核的MCU测试方法OA

An automated test method for microcontroller unit(MCU)based on the Cortex-M core is introduced.The method utilizes the V93000 automatic test equipment(ATE)to write different programs onto the MCU under test via the serial wire debug(SWD)interface and performs corresponding functional test.This approach effectively addresses the challenge of the repetitive configuration and loading of programs during MCU screening tests,achieving full automation without manual intervention.All program configuration,loading,and test verification processes are entirely handled by the ATE.This method optimizes the test verification process in MCU chip screening and significantly improves overall test efficiency.