首页|期刊导航|电子与封装|基于ATE的XC7K系列FPGA测试技术研究

基于ATE的XC7K系列FPGA测试技术研究OA

Research on Test Technology of XC7K Series FPGA Based on ATE

中文摘要英文摘要

FPGA具有可编程、高可靠性、方便使用等特点,被广泛应用于航空航天、通信电子等行业,因而对FPGA的测试具有重要意义.以XC7K系列FPGA为研究对象,基于自动测试设备(ATE),阐述了 FPGA的测试方法.介绍了 XC7K系列FPGA的资源和相关测试,探讨了 FPGA测试的全流程和测试原理、方法,对FPGA进行了测试验证.实验结果表明,该FPGA测试开发流程能快速有效开发XC7K系列FPGA测试程序,测试流程可供相关从业人员参考.

FPGAs are widely used in industries such as aerospace and communication electronics due to their programmability,high reliability,and ease of use,thus making FPGA test highly significant.Taking the XC7K series of FPGAs as the subject,the test methods for FPGAs are described based on automated test equipment(ATE).The resources and related tests of the XC7K series FPGAs are introduced,the complete flow,test principles,and methods of FPGA test are discussed,and the verification tests are conducted on the FPGA.Experimental results demonstrate that the FPGA test development process enables rapid and effective development of test programs for the XC7K series FPGAs.The test process can serve as a valuable reference for relevant practitioners.

朱洪;李星毅;易忠;宋建磊

贵州航天计量测试技术研究所,贵阳 550009贵州航天计量测试技术研究所,贵阳 550009贵州航天计量测试技术研究所,贵阳 550009贵州航天计量测试技术研究所,贵阳 550009

信息技术与安全科学

FPGAATE测试原理测试技术

FPGAATEtest principletest technology

《电子与封装》 2026 (5)

31-38,8

10.16257/j.cnki.1681-1070.2026.0059

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