基于半周期条纹二值编码的FPGA三维测量系统OA

In response to the pressing industrial demand for high-efficiency and low-power embedded 3D measurement systems,this pa-per presents an FPGA-based 3D measurement system by employing a half-period fringe binary encoding algorithmic architecture.The system first captures structured light images via a camera control module,followed by image buffering and filtering preprocessing.Le-veraging the parallel processing capability of FPGA,hardware acceleration is implemented for key algorithmic modules including wrapped phase calculation,phase unwrapping,and 3D point cloud reconstruction.Finally,the reconstructed results are transmitted to the host computer for visualization through a Gigabit Ethernet module,establishing a complete embedded 3D measurement pipeline.The experimental results demonstrate that the proposed system achieves a single 3D reconstruction time of 4 ms for images with a reso-lution of 720×540,with a system power consumption of 1.687 W and a fitting error of 0.053 2 mm in standard sphere measurements.These findings indicate that the system exhibits robust performance and practical utility while maintaining low power consumption,of-fering a viable solution for the implementation of embedded 3D measurement systems.