首页|期刊导航|光:科学与应用(英文版)|Phase-multiplied interferometry via cavity dynamics for resolution-enhanced coherent ranging

Phase-multiplied interferometry via cavity dynamics for resolution-enhanced coherent rangingOA

Phase-multiplied interferometry via cavity dynamics for resolution-enhanced coherent ranging

Yifan Wang;Xuling Lin;Liangcai Cao;Hongbo Sun;Yidong Tan;Jinsong Liu;Chenxiao Lin;Xin Xu;Yu Wang;Xinhang Yang;Binbin Xie;Jibo Han;Tengfei Wu

State Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaBeijing Institute of Space Mechanics and Electricity,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaState Key Laboratory of Precision Measurement Technology and Instruments,Department of Precision Instruments,Tsinghua University,Beijing,ChinaNational Key Laboratory of Metrology and Calibration,Beijing Changcheng Institute of Metrology & Measurement,Beijing,ChinaNational Key Laboratory of Metrology and Calibration,Beijing Changcheng Institute of Metrology & Measurement,Beijing,China

《光:科学与应用(英文版)》 2026 (3)

754-765,12

This work is supported by the National Key R&D Program of China under Grant(No.2024YFC2206801),China Postdoctoral Science Foundation under Grant(No.2024M761641),and National Natural Science Foundation of China(No.52505606).

10.1038/s41377-025-02160-x

评论