双层印制电路板交/直流下的电损伤与放电特性OA
Electrical Damage and Discharge Characteristics of Double-Layer PCB under AC and DC Voltages
电力电子设备的小型化与高功率密度化的发展趋势,对其配套绝缘材料的性能要求日益提高.封装材料与器件、键合线等结构之间存在大量界面,这些界面作为绝缘薄弱环节长期承受复杂电场作用,可能会引发局部放电、电树枝等电损伤问题.而目前针对复杂电场下印制电路板(PCB)封装绝缘的相关研究较少.该文通过对比分析交流和直流电压下双层 PCB 试样的电树枝特性,以及交/直流电压下双层 PCB 试样的局部放电特性,结合能量色散谱仪(EDS)表征层间绝缘损伤成分,探究了交/直流电场下 PCB 层间绝缘劣化机理的差异.实验结果表明,在交流电压下双层 PCB 试样的电树枝以枝状电树枝为主,局部放电是驱动交流下电树枝损伤生长的关键因素;在直流 30 kV 正压下双层 PCB 试样以枝状电树枝为主,当外施电压为 28 kV 时试样在 V 形电极附近生长铜须.交流下电树枝中的放电由外施电压的拉普拉斯场和电荷构建的泊松电场共同决定,在非导电电树枝中可以通过放电序列的外施电压差评估电树枝的生长程度;直流下电树枝的放电存在明显的记忆效应,在电树枝生长前期,平均放电时间间隔与放电幅值存在线性关系.双层 PCB 试样在交/直流下的电树枝放电幅值均随着电树枝的生长而增长,交流下电树枝的放电幅值与电树枝长度、放电序列电压差存在定量关系.较低的直流电压下双层 PCB 试样层间损伤为以 Cu、Cl 元素为主的铜盐,由于双层试样界面强度相对较弱,在强电场的作用下 Cu 离子在界面处迁移形成枝状损伤,因此在 PCB 直流工程应用中,需要充分考虑放电引发的电树枝和电化学迁移导致的铜须问题.
The trend of miniaturization and high power density of power electronic equipment has led to increasingly high requirements for the performance of insulation materials used in equipment.There are a large number of interfaces between packaging materials,devices,bonding wires,and other structures.These interfaces,as weak insulation parts,need to withstand complex electric field changes for a long time,which may cause electrical damage problems such as partial discharge and electrical trees.Currently,there are few insulation problems in printed circuit board(PCB)packaging under complex electric fields.This article compares and analyzes the electrical tree characteristics of double-layer PCB samples under AC and DC voltages,as well as the partial discharge characteristics of double-layer PCB samples under AC and DC voltages.Combined with energy dispersive spectrometer(EDS)characterization of interlayer insulation damage components,it explores the differences in the mechanism of interlayer insulation degradation of PCB under AC and DC electric fields. Firstly,the initial voltage of double-layer V-shaped PCB samples under AC and DC voltages was measured.The difference in initial voltage under AC and DC voltages was compared using a two parameter Weibull distribution.The results showed that the shape parameter of the starting voltage under DC voltage was 35.19,and the scale parameter was 30.41;The shape parameter of the peak voltage of the tree under communication is 6.51,and the scale parameter is 17.74.Comparison of the morphology of electrical tree under AC and DC,the electrical tree of double-layer PCB sample are mainly branch-like under AC voltage,while the morphology of the electrical tree under DC voltage is different between lower and higher voltages.At 30 kV positive voltage,the double-layer PCB sample shows similar branch-like tree as under AC voltage,but with relatively fewer branches.When the applied voltage is 28 kV,there are multiple branching points around the V-shaped electrode. Afterwards,the discharge characteristics during the growth process of AC/DC electrical trees were measured,and the variation of discharge magnitude with the length of electrical trees during the growth process was compared and analyzed.It was found that the maximum discharge magnitude gradually increased with the increase of electrical tree length.Based on phase-resolved partial discharge(PRPD)pattern and discharge sequence voltage difference method,the characteristics of electrical tree discharge under AC were analyzed.The voltage difference plot of the discharge sequence of electrical trees under AC changes from a linear shape to a double-hook hexagonal as the length of the electrical tree increase.The analysis of electrical tree discharge under DC voltage was conducted by comparing the time difference between adjacent discharges.The time difference of the discharge sequence under DC is positively correlated with the magnitude of the previous discharge during the early stage of electrical tree growth. Finally,based on EDS of electrical damage under AC and DC voltages,the differences in damage of double-layer PCB samples under AC and DC voltages were revealed.It was found that the damage of double-layer PCB samples under lower DC voltage amplitudes was a multi start point branched damage.The results of EDS confirmed that it was a copper salt containing Cu and Cl elements,and distributed on both sides of the PCB and epoxy resin.Due to the relatively weak interface strength of the double-layer sample,Cu ions migrate and form dendritic damage at the interface under the action of a strong electric field.
宋剑虹;吴振宇;曾祥桓;吕泽鹏;吴锴
西安交通大学电气工程学院 西安 710049西安交通大学电气工程学院 西安 710049西安交通大学电气工程学院 西安 710049西安交通大学电气工程学院 西安 710049西安交通大学电气工程学院 西安 710049
信息技术与安全科学
电树枝局部放电交/直流双层PCB结构界面损伤电化学迁移
Electrical treepartial dischargeAC and DCdouble-layer PCB structureinterface damageelectrochemical migration
《电工技术学报》 2026 (9)
3183-3193,11
国家自然科学基金(U23B20138)和电工材料电气绝缘全国重点实验室(EIPE23302)资助项目.
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