基于源极退化电阻的高电源抑制比带隙基准设计OA
Design of bandgap reference with high PSRR based on source degeneration resistor
为了提高低电源电压下带隙基准的电源抑制比(PSRR),提出了一种新型带隙基准结构.从降低失配和提高运算放大器增益两方面来提高电源抑制比.传统电流模带隙基准使用MOSFET复制电流时引入失配,造成电源抑制比下降.为了解决这个问题,使用带源极退化电阻的场效应晶体管和电阻进行电流复制.设计了高增益斩波放大器以降低失调电压和噪声.此外,设计了两段式曲率补偿结构来降低带隙基准的温度系数.该带隙基准源采用TSMC 65 nm混合信号CMOS工艺设计.在1.2 V电源电压下进行了 3 sigma蒙特卡罗仿真,仿真结果表明:该带隙基准在直流和10 kHz下的平均电源抑制比分别为-81.4和-48.9 dB;-40~125 ℃内,其温度系数为1.62× 10-6/℃;0.1~10 Hz范围内的积分噪声为15.5 μV.
In order to improve the power supply rejection ratio(PSRR)of bandgap reference(BGR)at low supply voltage,a novel bandgap reference structure was proposed.PSRR was improved by reducing mismatch and increasing the gain of operational amplifier.Conventional current-mode BGR introduce mismatch when using MOSFET to replicate current,resulting in a degradation of PSRR.To address this issue,resistor and MOSFET with source degradation resistor were used to replicate current.A high gain chopper amplifier was designed to reduce the offset voltage and noise.In addition,a two-stage curvature compensation structure was designed to reduce the temperature coefficient(TC).This bandgap reference was designed by TSMC 65 nm mixed signal CMOS technology.3 sigma Monte Carlo simulation was performed at a supply voltage of 1.2 V.Simulation results show that this BGR achieves a average PSRR of-81.4 dB at DC and-48.9 dB at 10 kHz.The TC of the BGR is 1.62× 10-6/℃ from-40 ℃ to 125 ℃.The integrated noise from 0.1 Hz to 10 Hz is 15.5 μV.
李琪;童乔凌;喻研;熊炫
华中科技大学集成电路学院,湖北 武汉 430074华中科技大学集成电路学院,湖北 武汉 430074华中科技大学集成电路学院,湖北 武汉 430074华中科技大学集成电路学院,湖北 武汉 430074
信息技术与安全科学
带隙基准高电源抑制比低噪声斩波技术源极退化电阻
bandgap referencehigh PSRRlow noisechopper techniquesource degeneration resistor
《华中科技大学学报(自然科学版)》 2026 (3)
1-7,7
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