小麦抗倒伏遗传位点与基因研究进展OA

Wheat lodging was a major factor limiting its high and stable yield,which severely affected grain yield,quality,and mecha-nized harvesting efficiency.With the development of molecular marker technology,researchers had systematically identified multiple quantitative trait loci(QTL)related to lodging resistance across the whole wheat genome,and co-localized 753 resistance loci,which were widely distributed on 21 chromosomes.The distribution of QTL on chromosomes 2B,4B,and 4D was particularly dense,forming hotspots for the genetic regulation of lodging resistance.The dwarfing genes Rht-B1 and Rht-D1 were confirmed to be key genes regu-lating plant height and enhancing lodging resistance.The application of techniques such as genome-wide association study(GWAS)and gene editing had further promoted the mining and functional verification of genes related to lodging resistance(e.g.,TaD11-2A,TaARF12,TaPRR1,and TaDEP1).Despite significant progress,most QTL were still in the stage of rough mapping,and the valida-tion of major QTL and their application in breeding still faced challenges.In the future,it is necessary to advance the fine mapping of QTL,the cloning and functional analysis of key genes,and to develop molecular marker-assisted selection and multi-gene pyramid-ing breeding strategies to support the genetic improvement of the lodging resistance trait in wheat and the breeding of new cultivars.