首页|期刊导航|自动化学报(英文版)|Collaboration Better Than Integration:A Novel Time-Frequency-Assisted Deep Feature Enhancement Mechanism for Few-Shot Transfer Learning in Anomaly Detection

Collaboration Better Than Integration:A Novel Time-Frequency-Assisted Deep Feature Enhancement Mechanism for Few-Shot Transfer Learning in Anomaly DetectionOA

Collaboration Better Than Integration:A Novel Time-Frequency-Assisted Deep Feature Enhancement Mechanism for Few-Shot Transfer Learning in Anomaly Detection

Wentao Mao;Jianing Wu;Shubin Du;Ke Feng;Zidong Wang

School of Computer and Information Engineering,Henan Normal University,Xinxiang 453007||Engineering Laboratory of Intelligence Business and Internet of Things of Henan Province,Xinxiang 453007,ChinaSchool of Computer and Information Engineering,Henan Normal University,Xinxiang 453007||Engineering Laboratory of Intelligence Business and Internet of Things of Henan Province,Xinxiang 453007,ChinaDepartment of Equipment and Mechanical Power,HBIS Group Tangsteel Company,Tangshan 063000,ChinaNational University of Singapore,Singapore 119260,Singapore||State Key Laboratory for Manufacturing System Engineering,Xi'an Jiaotong University,Xi'an 710049,ChinaDepartment of Computer Science,Brunel University London,Uxbridge,Middlesex UB8 3PH,UK

Anomaly detectionfeature enhancementfew-shot learningtime frequency analysistransfer learning

Anomaly detectionfeature enhancementfew-shot learningtime frequency analysistransfer learning

《自动化学报(英文版)》 2026 (2)

366-382,17

This work was supported in part by the National Natural Science Foundation of China(62472146)and the Key Technologies Research Development Joint Foundation of Henan Province of China(225101610001).

10.1109/JAS.2025.125702

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