电子跨接器可控硅老化引发灭磁回路隐性故障机理与防治措施研究OA
Mechanism and Prevention Measures of Latent Faults in De-Excitation Circuit Caused by Aging of Electronic Crowbar Thyristors
针对某水电厂因励磁系统电子跨接器可控硅老化击穿引发的灭磁电阻烧毁事故,开展全过程案例研究.通过故障时序重构与多源数据融合分析,揭示"器件老化→隐性导通→电阻热击穿"的三级故障跃迁链.研究提出基于全周期管理的防治体系,并构建可控硅健康状态AI预测模型(EHAM v1.0).现场应用验证了该模型与专项检测方法的有效性,可为同类型设备的状态评估与预测性维护提供系统性技术参考.
Aiming at the accident of de-excitation resistor burnout caused by aging and breakdown of thyristors in the electronic crowbar of the excitation system in a hydropower plant,a full-process case study is carried out.Through fault sequence reconstruction and multi-source data fusion analysis,the three-level fault evolution chain of"device aging-latent conduction-thermal breakdown of resistor"is revealed.A prevention and control system based on full-life-cycle management is proposed,and an AI prediction model for thyristor health status(EHAM v1.0)is constructed.Field application verifies the effectiveness of the model and special detection methods,which can provide systematic technical reference for condition assessment and predictive maintenance of similar equipment.
郑鸿
广西桂冠电力股份有限公司大化水力发电总厂,广西 大化 530899
建筑与水利
励磁系统灭磁回路可控硅老化隐性故障状态监测
excitation systemde-excitation circuitthyristor aginglatent faultcondition monitoring
《红水河》 2026 (1)
115-120,6
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