TMR电流传感器可靠性测试方法与失效退化分析OA

To comprehensively evaluate the long-term reliability of tunneling magnetoresistance(TMR)current sensors under harsh environments,a multi-stress accelerated testing methodology was established.The test matrix includes high-and low-temperature storage,damp-heat aging,thermal cycling,and electromagnetic disturbance tests,while key perfor-mance drifts and physical failure mechanisms are continuously monitored.The results show that the absolute sensitivity drift is ≤5％after 1 000 h storage at 150 ℃,and the absolute zero-offset drift is ≤3％with no progressive degradation af-ter 1 000 h biased aging at 85 ℃ and 85％relative humidity(RH).No functional failures are observed during thermal cycling(-40 ℃ ↔ 125 ℃)or under electrical fast transient(EFT)and surge stresses.Based on multi-stress lifetime modeling,the lifetime is projected to be decades under typical ambient conditions by translating accelerated-test results to nominal use conditions,meeting long-term reliability requirements for power equipment.Dominant failure modes include material aging at high temperatures,corrosion induced by package degradation in humid environments,and transient die-lectric breakdown during lightning surges.This study provides a scientific basis for TMR sensor lifetime assessment and high-reliability design.