TCTA薄膜多晶型结构与晶体生长动力学OA

4,4′,4″-tri(N-carbazolyl)triphenylamine(TCTA)is a widely used organic semiconductor material in optoelectronic devices,whose crystallization behavior significantly influences device photoelectric performance.However,a comprehensive understanding of its polymorphic structures and crystal growth kinetics remains lacking.In this study,the formation conditions of polymorphs and their growth kinetics in TCTA thin films were systematically investigated using polarized optical microscopy(POM)and atomic force microscopy(AFM).The results reveal the coexistence of two polymorphs with markedly different melting points.Notably,only Form Ⅰ with a lower melting point is observed when the film thickness is below 80 nm.Crystal growth kinetic analysis demonstrates that the low-melting-point polymorph exhibits faster growth rates and lower activation energy.This study deepens the understanding of crystallization behavior in TCTA thin films and provides valuable insights for tailoring their microstructure and homogeneity to improve the device performance.