多数据传输速率SerDes的测试方法研究OA

Serializer/deserializer(SerDes)parameter test is an indispensable part of chip test.However,testing the transmitter and receiver of a multi-data-rate SerDes generally needs to be carried out separately,and the test environment is relatively complex.Continuously changing the test environment leads to a lengthy test process and reliability reduction.Based on the test requirements of a multi-data-rate switching chip,a test setup is developed that enables simultaneous testing of the SerDes transmitter and receiver across multiple data rates.Furthermore,high-and low-temperature testing can be performed using the same setup without any modifications throughout the entire test process.Test results demonstrate that this test system can perform triple-temperature testing on the transmitter and receiver ends of SerDes chips with transmission rates ranging from 4.250-53.125 Gbit/s.The test method is convenient,and the test data is authentic and reliable.