Surface Sampling Depth Prediction on the Far Side of the Moon Based on Contact IndentationOA
Surface Sampling Depth Prediction on the Far Side of the Moon Based on Contact Indentation
Gao Zhang;Zongquan Deng;Meng Zou;Long Xue;Shengyi Jin;Yanhong Zheng;Xiaoyu Jia;Xiangjin Deng
School of Mechatronics Engineering,Harbin Institute of Technology,Harbin,Heilongjiang 150001,ChinaInstitute of Spacecraft System Engineering,CAST,Beijing 100094,ChinaSchool of Mechatronics Engineering,Harbin Institute of Technology,Harbin,Heilongjiang 150001,ChinaKey Laboratory for Bionics Engineering of Education Ministry,Changchun 130022,Jilin,ChinaCollege of Engineering,Jiangxi Agricultural University,Nanchang 330045,ChinaInstitute of Spacecraft System Engineering,CAST,Beijing 100094,ChinaInstitute of Spacecraft System Engineering,CAST,Beijing 100094,ChinaInstitute of Spacecraft System Engineering,CAST,Beijing 100094,China
《空间科学与技术（英文）》 2025 (5)
463-473,11
This work was supported by the National Science Foundation(52475019).
评论