普通小麦矮秆突变体20DH2-2遗传分析及株高QTL定位OA

Plant height is a key trait in the growth and development of wheat and has an important im-pact on wheat yield.To further identify quantitative trait loci(QTL)associated with plant height in wheat,this study utilized an F2 population derived from a cross between a dwarf mutant 20DH2-2 and a tall parent 21Hs-7.Genetic analysis of plant height was conducted using a mixed dominant gene plus multi-gene inheritance model.A genetic linkage map was constructed using the screening results of 620 simple sequence repeat(SSR)molecular markers,and QTL mapping analysis was performed in combination with the plant height phenotypic data of the F2 individuals.Results showed that the opti-mal genetic model for plant height was 2MG-EA(two equal additive major genes).Through bulked segregant analysis(BSA),26 polymorphic SSR markers were identified,constructing a genetic linkage map spanning 531.62 cM.Five plant height-related QTLs were detected on chromosomes 2A(two QTLs),4A,5A,and 6A,with logarithm of odds(LOD scores)ranging from 2.60 to 8.19 and ex-plaining 7.97％～22.88％of phenotypic variation.Specifically,QPH-nwafu-2A.2,QPH-nwafu-4A,QPH-nwafu-5A,and QPH-nwafu-6A tightly linked to molecular markers BQ838266(4.01 cM),Xwmc262(3.00 cM),Xwmc524(3.94 cM),and Xbarc107(0.69 cM),respectively.