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铜导线火灾熔痕的背散射电子衍射分析方法OA

Backscattered electron diffraction analysis method of copper wire fire marks

中文摘要英文摘要

采用电解抛光法制备铜导线熔痕试样,使用背散射电子衍射分析技术对不同种类铜导线熔痕织构的存在状态进行分析.结果表明:火焰熔痕与短路熔痕的织构状态存在明显差异,火焰熔痕基本不存在任何方向的织构,组织主要是粗大的等轴晶;一次短路熔痕与二次短路熔痕均存在明显织构,二次短路熔痕边缘易出现粗大的等轴晶或枝晶,而一次短路熔痕边缘以柱状晶分布为主.

Copper wire melt marks samples were prepared using electrolytic polishing method,and the existence status of melt marks texture in different types of copper wires was analyzed using backscattered electron diffraction analysis technology.The results show that there was a significant difference in the texture state between flame melt marks and short-circuit melt marks.The flame melt marks had almost no texture in any direction,and the microstructure was mainly coarse equiaxed crystals.Both primary and secondary short circuit melt marks had obvious textures,and the edges of secondary short circuit melt marks were prone to coarse equiaxed or dendritic crystals,while the edges of primary short circuit melt marks were mainly distributed as columnar crystals.

门腾腾;刘树帅;刘海旭;王永明

山东省公安厅物证鉴定研究中心,济南 250001山东大学材料科学与工程学院,济南 250016

背散射电子衍射分析;铜导线;火灾熔痕;织构;等轴晶

backscattered electron diffraction analysis;copper wire;fire melting mark;texture;equiaxed crystal

《理化检验-物理分册》 2024 (006)

10-14 / 5

山东省重点研发计划(重大科技创新工程)项目(2021CXGC011305)

10.11973/lhjy-wl240034

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